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Individual SWCNT Transistor with Photosensitive Planar Junction Induced by Two-Photon Oxidation

Emelianov, Aleksei V.; Nekrasov, Nikita P.; Moskotin, Maksim V.; Fedorov, Georgy E.; Otero, Nerea; Romero, Pablo M.; Nevolin, Vladimir K.; Afinogenov, Boris I.; Nasibulin, Albert G.; Bobrinetskiy, Ivan I.

ADVANCED ELECTRONIC MATERIALS
2021
VL / 7 - BP / - EP /
abstract
The fabrication of planar junctions in carbon nanomaterials is a promising way to increase the optical sensitivity of optoelectronic nanometer-scale devices in photonic connections, sensors, and photovoltaics. Utilizing a unique lithography approach based on direct femtosecond laser processing, a fast and easy technique for modification of single-walled carbon nanotube (SWCNT) optoelectronic properties through localized two-photon oxidation is developed. It results in a novel approach of quasimetallic to semiconducting nanotube conversion so that metal/semiconductor planar junction is formed via local laser patterning. The fabricated planar junction in the field-effect transistors based on individual SWCNT drastically increases the photoresponse of such devices. The broadband photoresponsivity of the two-photon oxidized structures reaches the value of 2 x 10(7) A W-1 per single SWCNT at 1 V bias voltage. The SWCNT-based transistors with induced metal/semiconductor planar junction can be applied to detect extremely small light intensities with high spatial resolution in photovoltaics, integrated circuits, and telecommunication applications.

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